Jornada Bibliography

Search

Show only items where

Author

Type

Term

Year

Keyword

Export 9 results:

Filters: Author is Foster, J. [Clear All Filters]

Journal Article

Foster J., Kelly R., Rango A., Armstrong R., Erbe E.F., Pooley C.D., Wergin W.P. 2006. Use of low-temperature scanning electron Microscopy to compare and characterize three classes of snow cover. Scanning. 28:191-203.

Rango A., Foster J., Josberger E.G., Erbe E.F., Pooley C.D., Wergin W.P.. 2003. Rime and graupel: Description and characterization as revealed by low temperature scanning electron microscopy. Scanning. 25:121-131.

Wergin W., Erbe E., Rango A., Foster J., Pooley C.. 2005. Low-temperature, scanning electron microscopy of artificial snow. Scanning. 27(2):63-64.

Wergin W.P., Rango A., Foster J., Erbe E.F., Pooley C.D.. 2002. Irregular snow crystals: structural features as revealed by low temperature scanning electron microscopy. Scanning. 24:247-256.

Erbe E.F., Rango A., Foster J., Josberger E.G., Pooley C.D., Wergin W.P.. 2003. Collecting, shipping, storing and imaging snow crystals and ice grains with low temperature scanning electron microscopy. Microscopy Research and Technique. 62:19-32.

Foster J., Rango A., Josberger E.G., Erbe E.F., Pooley C.D., Weregin W.P.. 2004. Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy. Scanning. 26:68-69.

Conference Proceedings

Wergin W.P., Rango A., Foster J., Josberger E., Erbe E.R., Pooley C.D.. 2006. Observations of snow and ice crystals with low temperature scanning electron microscopy (Review). 74th Annual Western Snow Conference. :3-14.

Wergin W.P., Rango A., Foster J., Erbe E.F., Pooley C.D.. 2002. Low-temperature scanning electron microscopy of irregular snow crystals. Journal of Microscopy and Microanalysis. 8:722-723.

Conference Paper

Wergin W.P., Foster J., Rango A., Josberger E., Erbe E.F., Murphy C.A., Pooley C.D.. 2005. Cryobionts in Snow and Ice Observed with Low Temperature Scanning Electron Microscope (SEM) and Transmission Electron Microscopy (TEM). Geological Society of American Meeting. 37:267,PaperNo.118-6.