Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy

TitleAdvances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy
Publication TypeJournal Article
Year of Publication2004
AuthorsFoster J., Rango A., Josberger E.G., Erbe E.F., Pooley C.D., Weregin W.P.
JournalScanning
Volume26
Pagination68-69
Date PublishedMarch 1, 2004
ARIS Log Number167177
Keywordsalpine, crystal, maritime, snow, taiga, tundra
AbstractIt is important to monitor the development of seasonal snow cover classes (tundra, taiga, alpine, maritime, prairie and ephemeral) worldwide and to visualize and understand snow crystal metamorphism. Low-temperature, scanning electron microscopy provides a superior form of snow crystal imaging and was successfully tested in taiga, alpine and prairie snowpacks with approximately 50% of the total depth made up of depth hoar crystals. The technique can be used easily for field data collection and provides a new tool for studying important snowpack processes with applications to avalanche and water supply forecasting.
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